Tungsten grids for atom probe specimen preparation.
These grids are presharpened (electropolished). Our design allows the specimens to easily be lifted and held with tweezers.
The grids may be used as support structures for focused ion beam lift-out Atom Probe samples, or they may be used as shadow masks to directly prepare tips by broad ion-beam thinning.
Use one of our new loading blocks to quickly and easily load these grids into our new spring-loaded specimen holders!
NEW! LOADING BLOCK:
https://www.microscopysuppliesaustralia.com/products/loading-block
NEW! SPECIMEN HOLDERS:
https://www.microscopysuppliesaustralia.com/products/new-atom-probe-specimen-holder